搜索结果: 1-1 共查到“计算机工程 wear”相关记录1条 . 查询时间(0.083 秒)
CMOS feature size scaling has been a source of dramatic performance gains, but it has come at a cost of on-chip wear-out. Negative Bias Temperature Instability (NBTI) is one of the main on-chip wear-o...