搜索结果: 1-1 共查到“半导体技术 Phenomena”相关记录1条 . 查询时间(0.093 秒)
Characterization of Series Resistances and Mobility Attenuation Phenomena in Short Channel MOS Transistors
MOS Transistor Surface roughness Effective mobility Series resistance
2010/12/8
The aim of this work is therefore to propose an original method especially conceived for the extraction of the series resistance Rsd. Using the approach of the Surface Roughness Scattering which enabl...