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Investigation on microstructure evolution of oxidized Ni/Au ohmic contacts to p-GaN by XRD
microstructure evolution Ni/Au p-GaN XRD
2010/7/15
The microstructure evolution of oxidized Ni (20nm)/Au (20nm) contact to p-GaN with increasing annealing temperature was studied by synchrotron x-ray diffraction (XRD) and powder XRD. With the increase...