搜索结果: 1-15 共查到“工学 Defects”相关记录44条 . 查询时间(0.315 秒)
Sodium-ion batteries have been touted as a sustainable alternative to lithium-ion batteries because they are powered by a more abundant natural resource. However, sodium-ion batteries have hit a signi...
Sometimes it’s good to be a little bad.
A new way to generate light using pre-existing defects in semiconductors（图）
半导体 高铟浓度 氮化铟镓LED
2023/6/7
Researchers from the Low Energy Electronic Systems (LEES) interdisciplinary research group at the Singapore-MIT Alliance for Research and Technology (SMART), MIT’s research enterprise in Singapore, to...
中国科学院苏州纳米技术与纳米仿生研究所蔺洪振研究团队Nano Letter：护锂英雄有孤胆，空缺之处是我家（SAC-in-Defects）（图）
蔺洪振 Nano Letter 金属 锂电池 可充电 二次电池
2021/4/8
便携式智能器件与长续航动力汽车的发展对可充电的二次电池的能量密度提出了更高的要求。金属锂电池因其高比容量（3860 mA h g-1）和较低的标准电压而备受关注，是理想的高能量密度负极材料。然而，锂金属电池的实际应用仍面临不可控的锂离子动力学问题，如不可控的锂沉积和溶解行为、固态电解质中间相（SEI）界面的反复生成和变形以及体积膨胀等，这会引起严重的锂枝晶问题并缩短锂金属循环寿命。我们在前期的正极...
New Technique Developed by Team Including CMU President Suresh Removes Defects While Keeping Materials Strong
CMU President Removes Defects Keeping Materials Strong
2015/11/12
When designing a new material, whether for an airplane, car, bridge, mobile device, or biological implant, engineers strive to make the material strong and defect-free. However, methods conventionally...
Configuration of VLSI Arrays in the Presence of Defects
Circuit area fault tolerance percolation theory probabilistic analysis queuing processes systolic arrays
2015/8/14
The penalties for configuring VLSI arrays for yield enhancement are assessed. Each dement of the fabricated array is assumed to be defective with independent probability p. A fixed fractmn R of the el...
Configuration of VLSI Arrays in the Presence of Defects
Circuit area fault tolerance percolation theory probabilistic analysis queuing processes systolic arrays wafer-scale integration wire length
2015/8/12
The penalties for configuring VLSI arrays for yield enhancement are assessed. Each dement of the fabricated array is assumed to be defective with independent probability p. A fixed fractmn R of the el...
A computer memory with defects is modeled as a discrete memoryless channel with states that are statistically determined. The storage capacity is found when complete defect information is given to the...
Researchers at Rice University have created flexible, patterned sheets of multilayer graphene from a cheap polymer by burning it with a computer-controlled laser. The process works in air at room temp...
University of Oregon chemists provide a detailed view of traps that disrupt energy flow, possibly pointing toward improved charge-carrying devices
George NazinEUGENE, Ore. — Oct. 21, 2014 — Universit...
Spatially resolved positron annihilation spectroscopy on friction stir weld induced defects
Spatially resolved positron annihilation spectroscopy friction stir weld induced defects
2010/10/12
A friction stir welded (FSW) Al alloy sample was investigated by Doppler broadening spectroscopy (DBS) of the positron annihilation line. The spatially resolved defect distribution showed that the mat...
Efficiency of two non-destructive testing methods to detect defects in polymeric materials
Efficiency testing methods detect polymeric materials
2010/8/12
There are many different non-destructive testing techniques which can be applied to polymer materials, but so far, ultrasounds has occupied one of the leading places [1-4]. Nowadays, also utilization ...
The elimination of micropores and surface defects in aramid-silicon laminated materials with special properties
Composites Engineering polymers Biomaterials
2009/12/14
Purpose: Development of the manufacturing technology of aramid-silicon laminated material and define of the micro-cavities amount during production of the laminates and identification of their influen...
Detection and Localization of Defects in Monocrystalline Silicon Solar Cell
solar cell electric signals combination of electric and optical methods
2011/4/21
Near-surface defects in solar cell wafer have undesirable influence upon device properties, as its efficiency and lifetime. When reverse-bias voltage is applied to the wafer, a magnitude of electric s...
Detecting of defects in polymeric materials using pulsed infrared thermography
Non-destructive testing (NDT) Thermography Defect
2009/12/2
Purpose: The aim of this paper was to determine the possibility of the use of non-destructive thermographic
testing to detect defects in polymeric materials and steel in compare purpose. To use the t...