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第20届非接触原子力显微镜国际会议（20th International Conference on Non-Contact Atomic Force Microscopy）
第20届 非接触原子力 显微镜 国际会议
2017/7/6
NC-AFM 2017 is the 20th international conference on Non-Contact Atomic Force Microscopy (NC-AFM), which is one of the most influential conference series in the field of scanning probe microscopy.
Vesicle Adsorption and Lipid Bilayer Formation on Glass Studies by Atomic Force Microscopy
crystal structure single crystal X-ray diffraction rare earth metal transition metal silicon
2016/5/24
The adsorption of phosphatidylcholine (PC) vesicles (30, 50, and 100 nm nominal diameters) and of dye-labeled PC vesicles (labeled with 6% Texas Red fluorophore (TR) and encapsulated carboxy fluoresce...
Applications of atomic force microscopy for the assessment of nanoscale morphological and mechanical properties of bone
Atomic Force Microscopy Scanning probe microscopy
2014/11/6
Scanning probe microscopy (SPM) has been in use for 30 years, and the form of SPM known as atomic force microscopy (AFM) has been around for 25 of those years. AFM has been used to produce high resolu...
State Feedback Control for Adjusting the Dynamic Behavior of a Piezoactuated Bimorph Atomic Force Microscopy Probe
State Feedback Control Dynamic Behavior Piezoactuated Bimorph Atomic Microscopy Probe Atomic Physics
2012/4/24
We adjust the transient dynamics of a piezo-actuated bimorph Atomic Force Microscopy (AFM) probe using a state feedback controller. This approach enables us to adjust the quality factor and the resona...
The Role of Nonlinear Dynamics in Quantitative Atomic Force Microscopy
Role Nonlinear Dynamics Quantitative Atomic Force Microscopy
2012/2/27
Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their ability to accurately determine the tip-surface force from analysis of the nonlinear cantilever motio...
Two type of 180 domain walls on a 115 nm cobalt film are observed by magnetic force microscopy.The surface Neel wall on top of an asymmetric Bloch wall is found inbomogeneous with the width estimated ...
An in-plane gate transistor fabricated by using the atomic force microscopy (AFM) lithography is investigated in this paper. By performing repeated oxidation and de-oxidation procedures by using AFM f...
RSC remodeling of oligo-nucleosomes: an atomic force microscopy study
RSC oligo-nucleosomes atomic force microscopy study
2011/1/5
RSC is an essential chromatin remodeling factor that is required for the control of several processes including transcription, repair and replication. The ability of RSC to relocate centrally position...
Topographic and electronic contrast of the graphene moiré on Ir(111) probed by scanning tunneling microscopy and non-contact atomic force microscopy
Topographi electronic contrast tunneling microscopy non-contact atomic force microscopy
2010/11/23
Epitaxial graphene grown on single crystal transition metal surfaces typically exhibits a moiré
pattern due to the lattice mismatch between graphene and the underlying metal surface. We use si-multan...
Quantitative magnetic force microscopy on permalloy dots using an iron filled carbon nanotube probe
Magnetic Force Microscopy tip-induced magnetization iron lled carbon nanotube
2010/11/17
We have characterized a new Magnetic Force Microscopy (MFM) probe based on an iron lled
carbon nanotube (FeCNT) using MFM imaging on permalloy (Py) disks saturated in a high magnetic
eld perpendic...
Potential contributions of noncontact atomic force microscopy for the future Casimir force measurements
Potential contributions noncontact atomic force microscopy the future Casimir force measurements
2010/11/5
Surface electric noise, i.e., the non-uniform distribution of charges and potentials on a surface, poses a great experimental challenge in modern precision force measurements. Such a challenge is enc...
Water distribution at solid/liquid interfaces visualized by frequency modulation atomic force microscopy
Water distribution solid/liquid interfaces visualized frequency modulation atomic force microscopy
2010/10/12
Interfacial phenomena at solid/water interfaces play an important role in a wide range of industrial technologies and biological processes. However, it has been a great challenge to directly probe the...
Magnetic Force Microscopy Study of New Nanocrystalline Soft Magnetic Ribbons
Magnetic Force Microscopy Study New Nanocrystalline Soft Magnetic Ribbons
2009/12/28
Magnetic Force Microscopy Study of New Nanocrystalline Soft Magnetic Ribbons.
Investigation of the topography of magnetron-deposited Cu/Ni multilayers by X-ray reflectometry and atomic force microscopy
multilayers Cu/Ni X-ray reflectometry (XRR)
2011/5/11
This paper presents the results of research of Cu/Ni multilayers magnetron-deposited on an Si (100) substrate. The thickness of Cu sublayers was identical in all multilayers and equalled 2 nm. The th...
Charge Characterization Of An Electrically Charged Fiber Via Electrostatic Force Microscopy
Electrically Charged Fibe Via Electrostatic
2009/3/2
The charge of a corona charged electret fiber as well as an uncharged glass fiber was characterized via Electrostatic Force Microscopy (EFM). Electrostatic force gradient images were obtained by monit...