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2017 SPIE 工业检验用光学测量系统会议（2017 Conference on Optical Measurement Systems for Industrial Inspection X）
2017 SPIE 工业检验 光学测量 系统会议
2017/4/25
Conference Sessions 1: Interometric Techniques I Congress-wide Plenary Session 2: Interometric Techniques II 3: Digital Holography and Holographic Microscopy 4: OCT and Coherence Scanning 5: High-Spee...
2017 SPIE X射线和EUV光学计量学进展专题会议（Advances in Metrology for X-Ray and EUV Optics VII）
2017 SPIE X射线 EUV光学计量学进展 专题会议
2017/4/25
Conference Sessions:1: At-Wavelength Metrology ;2: Metrology of VLS Gratings Technology Hot Topics: How Optics and Photonics Drive Innovation ;3: Calibration and Nanoradian Metrology ;4: Metrology Fac...
2017 SPIE 有机传感器和生物电子学专题会议（Organic Sensors and Bioelectronics X）
2017 SPIE 有机传感器 生物电子学 专题会议
2017/4/25
Conference Sessions:1: Organic Sensors and Bioelectronics I ;2: Organic Sensors and Bioelectronics II ;3: Organic Sensors and Bioelectronics III ;4: Organic Sensors and Bioelectronics IV Technology Ho...