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Capacitance-voltage profiling techniques for characterization of semiconductor materials and devices
Capacitance-voltage profiling techniques characterization of semiconductor materials devices
2010/11/23
This work re-defines the well-known C-V (capacitance-voltage)measurement technique, in the view of a new physics formula,discovered in 2006 [1].
Electrons and Phonons in GaN Semiconductor Quantum Well Devices
Electrons Phonons GaN Semiconductor Quantum Well Devices
2010/4/16
Electrons and polar optical phonons and their interactions are considered in the context of semiconductor quantum well devices, with particular reference to real quantum well laser structures. Distinc...